E – 07 Standard Test Method for Analysis of Aluminum and Aluminum Alloys by Atomic Emission Spectrometry, aluminum, aluminum alloys, atomic. Buy ASTM E TEST METHOD FOR ANALYSIS OF ALUMINUM AND ALUMINUM ALLOYS BY SPARK ATOMIC EMISSION. ASTM E Standard Test Method for Analysis of Aluminum and Aluminum Alloys by Spark Atomic Emission Spectrometry Scope
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The specimen serves as one electrode, the cathode.
ASTM E1251 – 17a
The unidirectional discharge does not attack the counter electrode, so that ee1251 can be used for many burns before renishing or replacement is necessary.
During calibration, eight burns of the standardants are recommended. If the analytical interest is just in low concentrations near the detection limit, a low standardant is used and either a gain or a background control may be adjusted. Active view current version of standard. Specific safety and health statements are given in Section The ow gage need not be incorporated in the system permanently, but may be connected at the outlet temporarily while initiating adjusting the operating ow, and then can be removed.
Cylinders of either compressed argon gas or liquid argon may be employed. To demonstrate compliance with legislated Hg content limits, use of an alternate method capable of analysis with a minimum reporting limit of 0. Aztm comments are invited either for revision of this standard or for additional standards and should be addressed to ASTM Headquarters. In either case, standardization requires only two or three minutes and can be repeated easily if there is reason to suspect signicant drift.
Burn the next ve or six calibrants. Signicance and Use 5. The rst two are used primarily for relatively simple analytical programs, covering only a few alloy types.
Usually, the background readings of a spectrometer remain relatively constant. Standardization is practiced customarily at the start of each new shift or operatorusing several high reference materials that between them cover the high ranges for all elements. E will depend on the specic equipment, and a tradeoff that the individual laboratory selects between speed of analysis and slightly improved precision and accuracy with longer times. This standard is subject to revision at any time by the responsible technical committee and must be reviewed every ve years and if not revised, either reapproved or withdrawn.
This, in turn, may produce concentration readings for silicon that are too high by 0. The computer may have calculated a curve that weaves in and out between the points for the calibrants. An Angstrom is dened as 0. For the values marked with an F, the available data was for a concentration greater than ten times but less than times the expected detection limit.
Concentration or concentration ratio plots can be employed. The wavelength coverage must include the analytical lines required for the needed concentration ranges, as listed in Table 1. Users of this standard are expressly advised that determination of the validity of any such patent rights, and the risk of infringement of such rights, are entirely their own responsibility.
To demonstrate compliance with legislated Hg content limits, use of an alternate method capable of analysis with a minimum reporting limit of 0. Argon gas shall be introduced just inside the fused quartz window, owing toward the discharge, to prevent any of the metal powder produced at the discharge from coating the inside of the window. F See footnote E.
The data are based on ten successive readings. This keeps the system as simple as possible and eliminates a possible source of organic contaminants or leaks.
The American Society for Testing and Materials takes no position respecting the validity of any patent rights asserted in connection with any item mentioned in this standard. NOTE 4—The background equivalents and detection limits listed in Table 1 can be attained with a reciprocal linear dispersion of 5.
Standardization for each matrix is similar to that described in X1. With a strip astmm or X-Y recorder, concentration scales may be preprinted on the paper, as illustrated in Test Method E The specimen shall seal the 8 to 15 mm opening in the top of the excitation chamber.
D Background Equivalent—The concentration at which the signal due to the element is equal to the signal due to the background. In routine use, whenever a different alloy type has to be analyzed, a type reference material will be burned and the computer will apply lateral shifts to the standardized curves, appropriate to each element in that alloy. Other forms may be analyzed, provided that: Refer to Practices E and E for guidance.
Inaccurate reporting of Hg due to these interference effects can jeopardize the current designation of aluminum production as a mercury-free process. H Interference Factor, k—The apparent increase in the concentration of the element being determined, expressed in percent, due to 1.